Technology for Polarization Measurement

EKKO™ CD MicroPlate Reader - Spectroscopic Scan

Spectroscopic Scan of 5 wells, 260-320 nm

EKKO™ CD MicroPlate Reader - Single Wavelength

96 Wells, Single Wavelength Measurement in Real Time

Exicor PV-Si

Birefringence Measurements System for Si ingots

Exicor OIA™

Oblique Incident Angle Birefringence Measurements System for lenses and lens blanks

GEN6™ with Auto-Tilt Feature

Large Format Display Glass Birefringence Measurements System

Exicor GEN5™ Series

Large Format Display Glass Birefringence Measurements System

Exicor GEN5™ Series - Chinese Subtitles

Large Format Display Glass Birefringence Measurements System

Exicor 300AT™

Birefringence Measurements System for parallel faced samples and multiple sample scanning