Resources
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Application Notes
Applications
- Astronomical Source Measurements
- Biological Structures
- Evaluation of New Magnetic Materials
- Fiber/Laser/Crystal Metrology
- Liquid Crystal Display
- Optical Lithography
- Discrete Optic Curved Surfaces
- Lens and Lens Blank Characterization
- Level Sense and Alignment in Steppers and Scanners
- Photomask Evaluation
- Stress in Silicon
- Pharmaceuticals – Drug Development
- Polarimetry
- Polymer Birefringence
- Remote Sensing
- Solar Cell Birefringence
- Thin Films
- Tokamak Plasma Diagnostics
- TRISO Nuclear Fuel Evaluation
Dimensions
- 2-MGEM Dimensions
- APD-100 Dimensions
- CD MicroPlate Reader Dimensions
- DET-200 Dimensions
- Exicor® 120AT Dimensions
- Exicor® 300AT Dimensions
- Exicor® 500ATi Dimensions
- Exicor® 400HD Dimensions
- Exicor® 600HD Dimensions
- Exicor® 800HD Dimensions
- Exicor® 1000HD Dimensions
- Exicor® 1500HD Dimensions
- Exicor® DUV 193-150 Dimensions
- Exicor® DUV 193-300 Dimensions
- Exicor® GEN5 LCD Dimensions
- Exicor® GEN5.5 LCD Dimensions
- Exicor® GEN6 LCD Dimensions
- Exicor® GEN9 2X Dimensions
- Exicor® OIA Dimensions
- Exicor® MicroImager™ Dimensions
- High Speed Optical Chopper Dimensions
- PEM-200 Controller
- PEM Head Assembly, 20-23 kHz Dimensions
- PEM200 Head Assembly, II_55, 60 FS kHz Dimensions
- PEM200 Head Assembly, 42, 47, 50 FS kHz Dimensions
- PEM200 Head Assembly, II_37, 42, 50 ZS Dimensions
- PolSNAP™ Dimensions
- Signaloc™ 2100 Lock-In Amplifier Dimensions
- Stokes Polarimeter with APD Dimensions
- Stokes Polarimeter with DET-200 Dimensions
Newsletters
- Solar Imaging Stokes Polarimetry
- Simultaneous MCD & Double Beam Absorption Spectra
- Chopping a Light Beam
- Rapid Scan Polarization-modulated Fourier-transform Infra-red Reflection Absorption Spectroscopy
- PEM-based Vibrational Circular Dichroism
- Measuring Fiber Orientation Anisotropy in Paper Using Infrared Ellipsometry
- Seeing Through Foggy Media with Phase-Modulated Light
- Modulated Interference Effects in Photoelastic Modulators
- Sensitivity to Atomic Monolayers with PEM-based Reflectance Anisotropy Sensors
- Magnetism in a New Light
- A PEM-based Stokes Polarimeter for Tokamak Plasma Diagnostics
Product Bulletins
- 2-MGEM Optical Anisotropy Factor Measurement System
- 150XT Mueller Polarimeter Product Bulletin
- APD-100 Product Bulletin
- CD MicroPlate Reader Product Bulletin
- DET-200 Product Bulletin
- Exicor 193DUV Product Bulletin
- Exicor GEN Series Product Bulletin
- Exicor GEN6-TW Product Bulletin
- Exicor® MicroImager™ Product Bulletin
- Exicor OIA Product Bulletin
- Exicor PV-Si Product Bulletin
- Exicor Systems Product Bulletin
- High Speed Optical Chopper Product Bulletin
- PEM-100 Controller Product Bulletin
- PEM200 Product Bulletin
- PolSNAP™ Stokes Polarimeter Product Bulletin
- Stokes Polarimeter Product Bulletin
Software
Technical Notes
- Calculating Psi and Delta Using a Photoelastic Modulator from a Lock-In Amplifier
- Detecting the Ratio of IAC/IAVE
- Optical Chopper Performance with Wavelength
- Polarized Light and Its Interaction with Modulating Devices, J.C. Kemp
- Short Description of the 2MGEM for the evaluation of pyrocarbon Anisotropy
- Selecting a PEM Optical Head
- Useful Aperture of PEMs
- Using a Mechanical Chopper with a PEM to Measure VDC
Technical Overviews
Techniques
- Birefringence Measurement
- Dichroism
- Circular Dichroism
- Magnetic Circular Dichroism
- Vibrational Circular Dichroism
- Linear Dichroism
- Vibrational Linear Dichroism
- Fluorescence Anisotropy/Fluorescence Polarization
- MOKE
- Mueller Polarimetry
- Optical Chopping
- Ellipsometry
- Optical Rotation
- Faraday Rotation
- PM IRRAS
- Polarization Scrambling
- Reflection Difference/Anisotropy Spectroscopy
- Rheology
- Scattering Media
- Stokes Polarimetry