Awards & Recognition - Hinds Instruments

2013. R&D 100 Award (150 XT Mueller Polarimeter)

2008. R&D 100 Award (2-MGEM Optical Anisotropy Factor Measurement System)

2008. SPIE Prism Award finalist (2-MGEM Optical Anisotropy Factor Measurement System)

2003. R&D 100 Award (Exicor® DUV Low Level Birefringence Measurement System)

2003. Photonics Circle of Excellence Award (Exicor® DUV Birefringence Measurement System)

2001. R&D 100 Award (Exicor® 150AT)

2001. Photonics Circle of Excellence Award (Exicor® 150AT)

2000. CLEO 2000 New Product Award (Exicor® 150AT)

Plus, a long history of public and proprietary IP achievements including US (20+) and international patents that continues to grow.

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Featured Article

JPL and Hinds Instruments: Celebrating Nearly Two Decades of Collaborative Design to Put PEMs in Space Under NASA Projects

JPL and Hinds Instruments team up to put PEMS in space under NASA projects.

Upcoming Event

CLEO 2024

The industry's leading event on laser science, the Conference on Lasers and Electro-Optics (CLEO) is the premier international forum for scientific and technical optics.

Project ’71

Over 50 years ago, Hinds Instruments was founded and thus began what has become an incredible journey.