Birefringence Measurement Systems
Birefringence Measurement Technology
Hinds Instruments Birefringence Measurement technology has been adopted by industry leaders world wide to measure birefringence and characterize stress birefringence in materials with unsurpassed accuracy, resolution and repeatability.
Capable of measuring optical retardation at 0.001nm resolution with noise floors as low as 0.005nm, these systems are robust, dynamic and scalable to fit the demanding requirements of your application. We provide measurement systems across the light spectrum (DUV, VIS, and NIR) and are able to measure virtually all optical materials.
Used to Measure
- Glass
- Display Components
- Injection Molded Plastics
- Drawn Fibers
- Fiber Optics
- Lithography Reticles
- Lens Blanks
- Lenses
- Silicon Wafers
- Minerals, Laser Crystals
- Liquid Crystals
- Birefringent Crystals
Exicor® AT Series
The AT Series is the original member of the Exicor® birefringence measurement system family of products. It also includes the workhorse model, serving both R&D and production requirements.
Exicor® GEN Series
The GEN Series systems provide unsurpassed low level birefringence measurements to support the precision characterization of display-related materials for the LCD industry.
Exicor® HD Series
The newly designed Exicor HD system offers a robust solution for heavy-duty sample measurements, featuring precision automated motion control elements and an all-steel base to support large samples. With customizable options and versatile configurations, including sample dimensions and customizable wavelengths and software.
Exicor® OIA
The OIA model applies oblique incident angle technology to permit high performance evaluation of lenses, parallel faced optics, and curved optics.
Exicor® DUV Series
The primary systems used by the leading lithography industry optics manufacturers to measure birefringence in lens blank materials and photo-mask blanks at DUV lithographic wavelengths.
Custom Birefringence Systems
The modular design of Exicor® birefringence measurement systems supports fast customization when required for your specific requirements.
Birefringence Accessories
A range of often critical accessory products are available, both standard and custom, to optimize the birefringence measurement of your application.
Can’t find what you’re looking for? Contact our customer service support techs in the United States and around the world. How to reach us.
Get A Quote for Systems & Components
Working together, we can discuss the suitability of our technology for your application, including a custom configuration of our base systems if needed.
Featured Article
JPL and Hinds Instruments: Celebrating Nearly Two Decades of Collaborative Design to Put PEMs in Space Under NASA Projects
JPL and Hinds Instruments team up to put PEMS in space under NASA projects.
Upcoming Event
