Technology for Polarization Measurement

World Leader in
Polarization Measurement Instrumentation

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Press Releases:

Hinds announces installation of next generation Exicor® OIA Birefringence Measurement System

Hinds announces advanced thermal control for the photoelastic modulator

SCHOTT and Hinds Instruments collaborate to study polarization artifacts in PV solar wafer materials

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OEM

Exicor^® 150 AT | Birefringence Measurement System

Founded in 1971, Hinds Instruments’ ultra high sensitivity instrumentation includes the PEM-100™, Exicor^®, Signaloc™ and other PEMLabs™ product lines.

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World Leader in Polarization Measurement Instrumentation

What's New

Use Environments

World Leader in
Polarization Measurement Instrumentation