2013. R&D 100 Award (150 XT Mueller Polarimeter)
2008. R&D 100 Award (2-MGEM Optical Anisotropy Factor Measurement System)
2008. SPIE Prism Award finalist (2-MGEM Optical Anisotropy Factor Measurement System)
2003. R&D 100 Award (Exicor® DUV Low Level Birefringence Measurement System)
2003. Photonics Circle of Excellence Award (Exicor® DUV Birefringence Measurement System)
2001. R&D 100 Award (Exicor® 150AT)
2001. Photonics Circle of Excellence Award (Exicor® 150AT)
2000. CLEO 2000 New Product Award (Exicor® 150AT)
Plus, a long history of public and proprietary IP achievements including US (20+) and international patents that continues to grow.