Technology for Polarization Measurement

2013. R&D 100 Award (150 XT Mueller Polarimeter)

2008. R&D 100 Award (2-MGEM Optical Anisotropy Factor Measurement System)

2008. SPIE Prism Award finalist (2-MGEM Optical Anisotropy Factor Measurement System)

2003. R&D 100 Award (Exicor® DUV Low Level Birefringence Measurement System)

2003. Photonics Circle of Excellence Award (Exicor® DUV Birefringence Measurement System)

2001. R&D 100 Award (Exicor® 150AT)

2001. Photonics Circle of Excellence Award (Exicor® 150AT)

2000. CLEO 2000 New Product Award (Exicor® 150AT)

Plus, a long history of public and proprietary IP achievements including US (20+) and international patents that continues to grow.