Technology for Polarization Measurement

The following is a brief listing of papers written by our end users between 1996-2000.  If you would like to have your paper included in our library, please contact Hinds Instruments.
 
 
Germanium and Germanium Compounds, Jack H. Adams and Dennis Thomas, Kirk-Othmer Encyclopedia of Chemical Technology (2000)

A new instrument for measuring both the magnitude and angle of low level linear birefringence, Baoliang Wang and Theodore C. Oakberg, Rev. Sci. Instrum., vol. 70 (10) (1999)

Soft x-ray circular dichroism and scattering using a modulated elliptically polarizing wiggler and double synchronous detection, J. C. Sutherland, K. Polewski, D. C. Monteleone, J. G. Trunk, et.al., SPIE Proceedings, vol. 3256 (1998)

Multiple scattering in chiral media: border effects, reduced depolarization, and sensitivity limit, Francoise Delplancke, Jacques P. Badoz, and Albert C. Boccara, SPIE Proceedings, vol. 3121 (1997)

Fast natural and magnetic circular dichroism spectroscopy, R. A. Goldbeck, D. B. Kim-Shapiro, and D. S. Kliger, Annu. Rev. Phys. Chem., vol. 48 (1997) (453-479)

Proton-induced transient depolarization in gallium phosphide and tellurium dioxide Bragg cells, E. W. Taylor, J. E. Winter, A. D. Sanchez, and S. J. McKinney, Opt. Eng., vol. 36 (7) (1997)

Development of scanning stress measurement method using laser photoelasticity, Y. Niitsu, K. Gomi, and K. Ichinose, JSME Int. J., Ser. A, vol. 40 (2) (1997)

Measurement of waveplate retardation using a photoelastic modulator, Theodore C. Oakberg, SPIE Proceedings, vol. 3121 (1997)

Measurement of low-level strain retardation in optical materials, Theodore C. Oakberg, SPIE Proceedings, vol. 3121 (1997)

Rapid-scanning interferometer for ultrafast pump-probe spectroscopy with phase-sensitive detection, W. M. Diffey and W. F. Beck, Rev. Sci. Instrum., vol. 68 (9) (1997)

Origin of modulated interference effects in photoelastic  modulators, Ernst Polnau and Hans Lochbihler, Opt. Eng., vol. 35 (11) (1996)

Effect of crystalline orientation on photoelastic constant of Si single crystal, K. Gomi and Y. Niitsu, SPIE Proceedings, vol. 2873 (1996)