Technology for Polarization Measurement

CUSTOM BIREFRINGENCE SYSTEMS

Exicor® has been designed to be adaptable and customized.  We pioneered nm range industrialized birefringence measurement and recognized early that polarization analysis, especially birefringence measurements, was dominated by new and custom endeavors.  We designed our products accordingly!

The varied and proprietary nature of our customers' processes dictate that we be able to adapt in a quick and cost effective way.  We have designed our systems to be modular by developing optical and electronic subsystems that can be quickly configured with minimal NRE (‘Non-Recurring Engineering’) fees.  We have specialized in, and pride ourselves on, the ability to quickly develop new systems.

We understand that the application of our technology can give our customers a distinct advantage in today’s highly competitive global economy.  This is why we manufacture over three dozen different models in the Exicor family of products.  Over two dozen of these models are custom configurations that have been designed to meet a customer’s specific requirements.

The flexibility of Exicor makes it the tool that will help you take your products and materials to the next level of competiveness and profitability!

CUSTOMIZATION OPTIONS:

The Exicor NEXUS Program

  • Our engineers work with you to understand and optimize birefringence measurements needs within your actual application environment.

High Speed Scanning

  • Hinds Scan in MotionTM

Custom Software

  • Special Features and Calculations
  • Custom UI elements (Graphs, Process Fields, Reports, etc.)
  • Process/Scan Automation Macros
  • Stress Optic Coefficient Calculations
  • Remote Interface Modules
  • DLLs

Custom Wavelengths

  • ATS – Spectroscopic (R,G,B)
  • Special Wavelengths and Light Sources (DUV, VIS, NIR)

Custom Mechanical

  • Mountings and Brackets
  • Gantry Frames
  • Stages and Motion Control

Special Optical Configurations

  • Compact Optical Systems
  • Reflective Path
  • Surface Polarization Properties

Mueller Polarization Parameters

  • Linear Retardation and Orientation (Standard Linear Birefringence)
  • Linear Diattenuation and Orientation
  • Circular Diattenuation
  • Optical Rotation

Further Reading:

SolarWorld and Hinds collaborate to build new Exicor®

NIR birefringence measurement system

 
Contact us for more information about what is possible and to see how Hinds Instruments works with our customers to provide unsurpassed polarization metrology.