Technology for Polarization Measurement

MUELLER POLARIMETERS

 

Hinds Instruments specializes in the development of custom Mueller Matrix Polarimeter Systems for challenging research and industrial process applications requiring ultra high sensitivity and repeatability in distinguishing specific, low level Mueller Matrix elements.

Our Applications Research Group has delivered best-in-class solutions to leading customers in flat panel display and optical lithography applications. These include applications requiring the measurement of:

√ Low-level linear and circular retardation, with minimal interaction between them

√  All 6 polarization parameters (linear retardation – magnitude and angle; circular retardation – magnitude; linear diattenuation – magnitude and angle; and circular diattenuation – magnitude) of DUV light, with minimal interaction between them.

√ Linear and circular retardation, where there is significant interaction between them.

Features:

  • Highest available sensitivity
  • Laboratory grade repeatability
  • Customized to polarization properties of interest
  • Minimal wavelength restrictions (DUV to IR)
  • Normal incident and oblique incident angle capability
  • Measurement cycle times appropriate for production processes
  • Software packages with extensive features
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    Contact Us to see how Hinds Instruments works with our customers to solve complex metrology problems.