Technology for Polarization Measurement

Thin Films

Thin films range from one atomic layer in thickness to several micrometers. They are commonly found in electronic semiconductor devices, such as computer memory, in optical coatings, such as antireflective coatings, and are even being applied in drug delivery.

Polarized light and the polarizing capability of a thin film sample offer an excellent way to characterize those samples and have led to the development of a number of thin film characterization techniques.  Hinds Instruments’ polarization modulation techniques offer a way to improve precision and accuracy in these methods.

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Contact us to see how Hinds Instruments works with our customers to solve complex metrology problems.