Technology for Polarization Measurement

Optics and Crystals

A wide array of technology roll-outs in the 21st century, ranging from consumer products to research applications, depend on unambiguous determination of polarimetric properties at very small levels. Waveplates, crystals, lenses, polarization films, photonic materials and metamaterials, and other scientific optics interact with polarized light in ways that must be precisely measured, defined and controlled.

Exicor® systems provide repeatable, sub-nm and micro-degree level analysis of the polarization parameters that are of interest to researchers and production engineering designers alike. Common examples include examining the ultra-low level retardation anisotropy of waveplates; measuring the small innate strain birefringence in crystals along different orientations; measuring the properties of individual layers of complex engineered multi-layer substrates; measuring the unexpected circular birefringence from the liquid crystal layer of an LCD panel, the large linear dichroism of LCD polarizers, or the complete optical effect of all the layers working together; etc.
Exicor models of particular relevance include:

150XT Mueller Polarimeter – particularly useful when the measurement of a single optical property insufficiently examines the optical material under investigation

If you have questions about measuring a polarimetric parameter(s) for a particular optic or crystal and can’t find the information you need in one of these links, please contact us and ask to speak with one of our product application specialists.