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Ultra-Safe Nuclear Corporation Enhances Safety and Productivity with Advanced TRISO Fuel Analysis Using Hinds Instruments' Exicor® 2-MGEM System.

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Hinds Instruments
  • Products
    • Systems Image Systems
      • Birefringence Measurement Systems
      • Exicor® MicroImager™
      • Stokes Polarimeters
      • Mueller Polarimeters
      • EKKO™ CD MicroPlate Reader
    • Components Image Components
      • Photoelastic Modulators
      • Photo Detectors
      • Lock-in Amplifiers
      • Kits
      • High Speed Optical Choppers
  • Services
  • Resources
    • Customer Publications
    • News & Events
    • FAQs
  • About Us
    • Project ’71
    • International Representatives
    • Careers
    • James Kemp
  • 1-503-690-2000
  • Contact Us

Hinds Instruments

Posts by sarah:

  • Hinds Instruments Announces Installation of Next Generation Exicor® OIA Birefringence Measurement System Posted on April 18, 2012 by Hinds Instruments in News
  • Hinds Photoelastic Modulators with Advanced Thermal Control Posted on January 20, 2012 by Hinds Instruments in News
  • Residual Stress Birefringence in Optical Materials Posted on November 30, 2011 by Hinds Instruments in News
  • SCHOTT and Hinds Instruments collaborate to study polarization artifacts in PV solar wafer materials Posted on November 1, 2011 by Hinds Instruments in News
  • Hinds Instruments Celebrates 40 Years Posted on November 1, 2011 by Hinds Instruments in News
  • Use of PEMs in Magneto Optic Kerr Effect Experiments Posted on October 13, 2011 by Hinds Instruments in News
  • Hinds Instruments and New York University Lab collaborate on GOALI grant Posted on September 20, 2011 by Hinds Instruments in News
  • Hinds Instruments Signaloc™ 2100 Lock-in Amplifiers match the sensitivity of popular commercially available lock-ins. Posted on September 15, 2011 (December 27, 2023) by Hinds Instruments in News
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