120 AT Birefringence Measurement System
The new Exicor® 120AT is versatile enough to excel in both production floor and R&D lab environments. The bench top design and intuitive automated scanning software make this product ideal for day-in-day-out evaluation of small parts (up to 120 mm x 100 mm).
The standard high speed scanning package, Scan in Motion™ or SIM, makes high spatial resolution scans (<1 mm grid spacing) practical.
Applications:
Stress Retardation Measurements:
- Plastic films
- Lens blanks
- Laser crystals
- Cell phone display windows
Features:
- Automated XY stage
- 2D and 3D graphical representation of birefringence parameters
- Bench top design
- Advanced data analysis features included standard in user interface
SPECIFICATIONS
| Retardation Range: | 0.005 to 300+ nm |
| Retardation Resolution / Repeatability1, 2: |
0.001 nm / ± 0.02 nm |
| Angular Resolution / Repeatability3: |
0.01º / ± 0.07° |
| Measurement Rate / Time4: | 15 samples/sec (at 1nm spacing) |
| System Dimensions: | 715 mm (H) x 350 mm (W) x 360 mm (D) |
| Light Source Wavelength5: | Various (633 nm standard) |
| Measurement Spot Diameter6: | Between 1 mm and 3 mm |
| Measurement Units: | nm (retardation), ° (angle) |
1 Typical performance at 5 nm retardation
2 Up to 2 nm, 1% thereafter
3 Typical performance at 10 nm retardation
4 Maximum data collection speed. Sample XY scan time dependent on stage movement parameters.
5 Custom wavelengths available
6 Spot sizes of less that 1 mm native require optional high resolution detector module
FURTHER READING:
Contact us for more information about the Exicor 120AT and to see how Hinds Instruments works with our customers to provide unsurpassed birefringence measurement metrology.
