Technology for Polarization Measurement

300 AT Birefringence Measurement System

The Exicor 300AT is an all new frame design supporting applications requiring heavier or quantity sample measurements. This entry level high capacity system of the Exicor® birefringence measurement system family brings efficiency, improved load and robustness to the forefront for both the lab and production environment. This model is well suited for larger and heavier samples (up to 300mm X 300mm and 250+mm thick) as well as multiple small sample batch-oriented evaluations.

The new design has a heavy duty stage for supporting heavier samples and maintaining stage flatness better than was possible with the previous similarly sized Exicor systems. By adding the optional Exicor Zones™ software to the 300AT the system can be setup to execute automated routines to scan each part individually and assign individual file names to each ‘zone’. This software allows the user to begin the routine and let it run for multiple shifts, overnight or even longer (depending on the application) without having to intervene.

With two measurement range options available to choose from (High Sensitivity and Extended Range) the system is well-suited to address the demanding requirements of your large samples. The optional high speed scanning package makes high spatial resolution scans (

Features:

  • Heavy duty automated XY stage
  • 2D and 3D graphical representation of birefringence parameters
  • 3 side easy access stage loading design
  • Large and flexible stage platform design for adding custom parts holders or process aids
  • Advanced data analysis features included standard in user interface

 

SPECIFICATIONS

High Sensitivity Extended Range
Retardation Range: 0.005 to 120+ nm 0.005 to 300+ nm
Retardation Resolution / Repeatability1, 2, 3: 0.001 nm / ± 0.008 nm 0.001 nm / ± 0.015 nm
Angular Resolution / Repeatability1: 0.01º / ± 0.05º 0.01º / ± 0.07º
Measurement Rate / Time4: up to 100 pps / sample size dependent
Size (cm): 120 (L) x 130 (W) x 200 (H)
Light Source Wavelength5: Various (632.8 nm standard)
Measurement Spot Diameter6: Between 1 mm and 3 mm native (can be as low as <50 µm)
Modulation Technique / Frequency: PEMLabsTM Photoelastic Modulator / 50 kHz and 50/60 kHz
Demodulation Analysis Technique: Hinds Instruments SignalocTM Lock-in Amplifier
Measurement Units: nm (retardation),° (angle)

 

1 Typical performance at 5nm retardation

2 Up to 0.8 nm, 1% thereafter

3 Up to 1.5 nm, 1% thereafter

4 Maximum data collection speed. Sample XY scan time dependent on stage movement parameters.

5 Custom wavelengths available

6Measurement spot sizes of less than 1mm (native) require optional high resolution detector module

OPTIONS:

  • Additional polarization parameters
  • Hinds SIM™ Solution (Scan in Motion - High Speed Scanning Hardware and Software)
  • Spectroscopic and RGB measurement solutions
  • Custom wavelengths (VIS, NIR)
  • Manual and automated tilt stages
  • Custom sample holders
  • Custom software (UI or DLL)
  • Third party automation support
  • Stress estimation calculations

Contact us for more information about the Exicor 300AT and to see how Hinds Instruments works with our customers to provide unsurpassed birefringence measurement metrology.