Exicor® HD Series
Above: Exicor® HD prototype
The Exicor® HD system is a newly designed heavy-duty sample measurement system based on Exicor's core low-level birefringence measurement technology and precision automated motion control elements. The Exicor HD is designed with an all steel base to support heavier samples. This brings the Exicor birefringence measurement system family to a new level of efficiency and improved robustness to accommodate even larger, heavier, and more numerous samples. The HD’s sample dimensions will start with the 400HD at 400mm x 400mm x 400mm(x,y,z) with a max sample weight of 250lbs/113kg and will end with the 2000HD at 2m x 2m x 500mm(x,y,z) with a max weight of 2,200lbs/1000kg. This new line of products makes the family of birefringence measurement systems more versatile than ever before.
The HD systems are also customizable to meet your every need. If your sample requires a vat for index matching fluid, we can customize it to accommodate for your vat. We can do custom wavelengths (VIS, NIR), as well as custom sample holders, and even provide custom software (UI or DLL).
| Exicor Platform | Motion | Model | Sample Dimensions | ||
|---|---|---|---|---|---|
| Nomenclature | X/Y | Z | Max. Weight | ||
| HD | Sample | 400HD | 400 x 400 | 400mm | 250lbs / 113kg |
| HD | Sample | 600HD | 600 x 600 | 600mm | 500lbs / 225kg |
| HD | Gantry | 800HD | 800 x 800 | 500mm | 750lbs / 340kg |
| HD | Gantry | 1000HD | 1m x 1m | 500mm | 1100lbs / 500kg |
| HD | Gantry | 1500HD | 1.5m x 1.5m | 500mm | 1650lbs / 750kg |
| HD | Gantry | 2000HD | 2m x 2m | 500mm | 2200lbs / 1000kg |
SPECIFICATIONS
| Retardation Range: | 0.005 to 300+ nm | ||
| Retardation Resolution / Repeatability1, 2: | 0.001 nm / ± 0.015 nm | ||
| Angular Resolution / Repeatability1: | 0.01º / ± 0.07º | ||
| Measurement Rate / Time3: | up to 100 pps / sample size dependent | ||
| Light Source Wavelength4: | Various (632.8 nm standard) | ||
| Measurement Spot Diameter5: | Between 1mm & 3mm native (can be as low as <50 µm) | ||
| Modulation Technique: | PEMLabsTM Photoelastic Modulator | ||
| Measurement Units: | nm (retardation),º (angle) | ||
1 Typical performance at 5 nm retardation
2 Up to 1.5 nm, 1% thereafter.
3 Maximum data collection speed. Sample XY scan time dependent on stage movement parameters.
4 Custom wavelengths available
5 Measurement spot sizes of less than 1mm (native) require optional high resolution detector module
Contact us for more information about the Exicor HD to see how Hinds Instruments works with our customers to solve complex metrology problems.
