SCHOTT and Hinds Instruments collaborate to study polarization artifacts in PV solar wafer materials
Hillsboro, Oregon, November 1, 2011 – Hinds Instruments, a leading global supplier of photoelastic modulators (PEMs), Birefringence measurement systems and polarization analysis equipment, along with SCHOTT Solar Wafer GmbH announced today that they have begun a system development project to study polarization characteristic and stress birefringence in Silicon wafers and PV related materials. Hinds is…