Technology for Polarization Measurement

PEM 200 Optical Head Specifications

Model Optical
Material
Nominal
Frequency
Retardation Range Useful
Aperture1
Quarter
Wave
Half
Wave
I/FS50 Fused
Silica
50 kHz 170nm-
2µm
170nm-
1µm
16 mm
II/FS422 Fused
Silica
42 kHz 170nm-
2.6µm
170nm-
2.5µm
27 mm
II/FS472 Fused
Silica
47 kHz 170nm-
2.6µm
170nm-
2.5µm
24 mm
II/FS502 Fused
Silica
50 kHz 170nm-
2.6µm
170nm-
2.5µm
22 mm
II/IS422 Infrasil 42 kHz 300nm-
3.5µm
300nm-
3µm
27 mm
II/CF57 Calcium
Fluoride
57 kHz 2µm-
8.5µm
1µm-
5.5µm
23 mm
II/ZS37 Zinc
Selenide
37 kHz 2µm-
18µm
1µm-
9µm
19 mm
II/ZS42 Zinc
Selenide
42 kHz 2µm-
18µm
1µm-
10µm
17 mm
II/ZS50 Zinc
Selenide
50 kHz 2µm-
18µm
1µm-
10µm
14 mm

1 For a full discussion, consult the Useful Aperture Technical Note.
2 Please contact Hinds Instruments with your wavelength range for optical calibration.


Please contact us for a quotation on any of the modulators listed.



To learn more about the PEM, please visit PEM 200.

Options

Antireflective Coatings (ARC)

  • -Custom

Magnetic Field Compatible (MFC)

Special Frequency Option (SFO)

Non-Interference Option (NIO)

  • -NIO-1, standard on I/FS50
  • -NIO-2, custom on Series I optics

Vacuum Compatible Head Customization