Technology for Polarization Measurement

Notable developments over the years include:

2014. Exicor® MicroImager introduced, the first commercially available PEM-based birefringence imager allowing rapid, sensitive measurement of birefringence in biological samples as well as for industrial metrology.

2013. Exicor® Model 150XT introduced, the first commercially available 4-PEM Mueller Polarimeter providing simultaneous research grade measurement of all 16 M.M. elements with no moving parts.

2010. Development of Exicor® GEN Series systems for low level birefringence measurement of flat panel display glass.

2009. Signaloc™ 2100 research-grade lock-in amplifier introduced for PEM and non-PEM applications. 16-element Precision Full Mueller Matrix Polarimeter introduced. Polarization extinction ratio system introduced. DPG Delay Pulse Generator introduced for pulsed laser and other event-based PEM applications.

2008. Customized Exicor® MT System introduced for production line metrology.

2007. First 2-MGEM Optical Anisotropy Factor Measurement System shipped to a national next generation nuclear fuel development laboratory. Separately, Hinds Instruments partners with Jet Propulsion Laboratory (JPL) to achieve TRL-5 space-qualified PEMs.

2006. Precision 6-element Mueller Matrix Polarimeter introduced for optical lithography lens birefringence measurement.

2006. Introduction of PEM-100 product line.

2005. Installation of Class 1000 clean room for meeting customers’ clean-room compatible product requirements.

2004. Precision PEM-based Stokes Polarimeters delivered to IR, fiber and free space applications.

2003. International Sematech contracts with Hinds Instruments to develop the Exicor® DUV Birefringence Measurement metrology for 157nm, 193nm and 248nm.

2000. Development of first digital control based PEM design for high stability frequency and class 10,000 clean air applications. Separately, Hinds Instruments partners with Oak Ridge National Laboratory in a CRADA to develop advanced PEM-based ellipsometry.

1999. Introduction of Exicor® Birefringence Measurement System providing breakthrough low-level (0.005 nm) birefringence measurement capability.

1997. Introduction of UHV compatible vacuum chamber PEM systems.

1995. Development of Modulated Interference theory and practical solutions for laser-based experiments.

1994. Breakthrough in IR PEM design with introduction of stable ZnSe units capable of half wave retardation to 10 microns.

1991. Introduction of the Single Cavity, Large Dual PEM System design for Stokes polarimetry applications, principally in plasma fusion tokamak reactors.

1991. Introduction of the PEM-90 product line, offering digital control of the PEM system user interface, RS232C and GPIB interfaces, as well as other advances.

1989. Development of the Industrial Circular Dichroism Monitor, capable of detecting a chiral molecular species at concentrations down to 1 ppm.

1982. Introduction of the PEM-80 product line, combining "PEM" rectangular and "JCK" octagonal circuits into one unified design.

1976. Introduction of patented symmetric PEMs.